Citation
Sambandan, S.; Apte, R. B.; Wong, W. S.; Lujan, R.; Young, M.; Russo, B.; Ready, S. E.; Street, R. A. Defect identification in large area electronic backplanes. IEEE Journal of Display Technology; 2009 January; 5 (1): 27-33.
Abstract
We describe a rapid testing system for active matrix TFT backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.
