Timing the Occurrence of Randomly Spaced Events using $V_{T}$ Shift in Disordered Semiconductors

Abstract

This paper discusses the concept of using threshold voltage shift ($V_{T}$ shift) in disordered semiconductors based thin film transistors to measure the time of occurrence of randomly spaced events of interest. We call the experimental circuit an ‘analog clock’. The analog clock is shown to be accurate while at the same time being simple in design using just one transistor.